发明名称 |
Method of three-dimensional measurement with few projected patterns |
摘要 |
Methods are provided for reducing the number of projected patterns required to make two- or three-dimensional surface measurements on a sub-class of surfaces comprising relatively smooth surfaces. By including apriori knowledge about the surface to be measured, pattern ambiguities can be resolved by processing rather than by additional projected patterns.
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申请公布号 |
US4634279(A) |
申请公布日期 |
1987.01.06 |
申请号 |
US19850794612 |
申请日期 |
1985.11.04 |
申请人 |
ROBOTIC VISION SYSTEMS, INC. |
发明人 |
ROSS, JOSEPH;SCHMIDT, RICHARD |
分类号 |
G01B11/25;(IPC1-7):G01B11/24 |
主分类号 |
G01B11/25 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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