发明名称 FINE PROCESSING OF SINGLE CRYSTAL SILICON
摘要 PURPOSE:To give roundness to an angular upper corner edge produced by vertical etching of an Si substrate by applying a laser beam of visible ray range or ultraviolet ray range to the Si substrate after vertical etching. CONSTITUTION:A thermal oxide film 5 is formed on P-type (100) Si substrate 4. Then a pattern is formed with a positive type photoresist 6 and the thermal oxide film 5 is subjected to oriented etching by using the photoresist 6 as a mask. After the resist 6 is removed, the single crystal Si substrate 4 is etched and dipped into a buffer fluoric acid solution and the thermal oxide film 5 is removed and then an ArF excimer laser beam is applied. With this process, the Si surface layer is melted and an angular upper corner edge can be rounded.
申请公布号 JPS61296721(A) 申请公布日期 1986.12.27
申请号 JP19850137924 申请日期 1985.06.26
申请人 TOSHIBA CORP 发明人 ARIKADO TSUNETOSHI
分类号 H01L21/302;H01L21/3065 主分类号 H01L21/302
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