发明名称 BUILT-IN TEST SIGNAL GENERATOR
摘要 PURPOSE:To obtain a built-in test signal which simulates a reflected signal from a target by using part of a transmitted signal from a transmitter as it is or converting it by 180 deg.. CONSTITUTION:A signal X1 which is part of the transmitted signal is switched by a changeover switch 9a with a switching signal X2 from a controller 12. Then, it is inputted to a changeover switch 9b directly or through a 180 deg. phase shifter 10 and switched into an output signal X3 with a switching signal X2 from a controller 12. The signal X3 is pulse-modulated by a pulse modulator 11 with a pulse modulating signal X4 from the controller 12 to obtain the built-in test signal (BITE signal) X4.
申请公布号 JPS61284684(A) 申请公布日期 1986.12.15
申请号 JP19850126212 申请日期 1985.06.12
申请人 TECH RES & DEV INST OF JAPAN DEF AGENCY 发明人 ONISHI KIYONOBU;NAKAMURA MASAZUMI
分类号 G01S7/40;G01S13/52;G01S13/522 主分类号 G01S7/40
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