发明名称 |
BUILT-IN TEST SIGNAL GENERATOR |
摘要 |
PURPOSE:To obtain a built-in test signal which simulates a reflected signal from a target by using part of a transmitted signal from a transmitter as it is or converting it by 180 deg.. CONSTITUTION:A signal X1 which is part of the transmitted signal is switched by a changeover switch 9a with a switching signal X2 from a controller 12. Then, it is inputted to a changeover switch 9b directly or through a 180 deg. phase shifter 10 and switched into an output signal X3 with a switching signal X2 from a controller 12. The signal X3 is pulse-modulated by a pulse modulator 11 with a pulse modulating signal X4 from the controller 12 to obtain the built-in test signal (BITE signal) X4.
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申请公布号 |
JPS61284684(A) |
申请公布日期 |
1986.12.15 |
申请号 |
JP19850126212 |
申请日期 |
1985.06.12 |
申请人 |
TECH RES & DEV INST OF JAPAN DEF AGENCY |
发明人 |
ONISHI KIYONOBU;NAKAMURA MASAZUMI |
分类号 |
G01S7/40;G01S13/52;G01S13/522 |
主分类号 |
G01S7/40 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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