发明名称 IC VISUAL TESTER
摘要 PURPOSE:To facilitate the automation of processes and visual test by a method wherein ICs are picked up and fed on a plane to be turned over by a turnover mechanism further to be located on carrier channels. CONSTITUTION:A shifting mechanism 2 picks up ICs 10 successively from a magazine 11 of magazine container 1 to shift the ICs 10 to the first carrier channel 31. The primary visual tester 51 visual-tests the ICs located on the specified position at the terminal of an IC feeder 41. A turnover shifting mechanism 6' turns over the ICs after the first visual test to shift them to the second carrier channel 32. The secondary visual tester 52 visual by tests the ICs located on the specified position at the terminal of another IC feeder 42. A visual test result judging mechanism 7 stores the results o the first visual test and adds thereto the results of the secondary test to make the final decision. A distribution mechanism 8 distributes the ICs 10 according to the decision. A control mechanism 9 controls the operations of each mechanism according to the specified schedules.
申请公布号 JPS61272945(A) 申请公布日期 1986.12.03
申请号 JP19850114322 申请日期 1985.05.29
申请人 TOSHIBA CORP;TOSHIBA MICRO COMPUT ENG CORP 发明人 KUSAKARI TERUO;TAKEDA TOYOHIKO
分类号 G01R31/26;G01N21/88;G01N21/956;H01L21/66 主分类号 G01R31/26
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