发明名称 TEMPERATURE TESTER FOR ELECTRONIC PARTS
摘要 PURPOSE:To enable a good portability, an easy movability and a facilitated use to be realized by mounting both a Joule heating unit element and a thermoelectric effect element to a heating medium member brought into contact with an electronic part. CONSTITUTION:A heating medium member 5 is formed from a metal piece, for example, aluminum or the like with a high thermal conductivity. The metal piece is processed to such a configuration as to be able to be brought into close contact with an electronic part 11. A temperature sensor 4 is buried in the heating medium member 5. A plurality of thermoelectric effect elements 2 and a plurality of resistance heating elements 3 are mounted to the heating medium member 5 while both the elements checkedly entering into each other. The heating medium member 5 is adapted to be quickly cooled or heated to a given preset temperature through a controller. Thus, an easy portability and a facilitated use are realized and only a target electronic part can be efficiently heated or cooled.
申请公布号 JPS61269085(A) 申请公布日期 1986.11.28
申请号 JP19850110320 申请日期 1985.05.24
申请人 HITACHI LTD 发明人 TSUYA HIDEKI;KATSUKI MITSUHIRO
分类号 G01R31/30;G01N17/00 主分类号 G01R31/30
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