| 摘要 |
<p>An interference polarization refractometer comprises a polarized emission source (1) and, located consecutively one after another along the emission path, a means for the light beam splitting into two orthogonally polarized light beams, a measuring cell (3), a reflector (4) with a plane reflecting surface, a half-wave plate (5), the second reflector (6) the reflecting surface of which is perpendicular to the reflecting surface of the first reflector, a means for space fusion of the light beams and a unit for measuring the path difference components of the elliptically polarized light. The reflectors (4 and 6) are rigidly interconnected whereas the means for splitting and the means for fusion of the orthogonally polarized light beams are constituted by a single plane-parallel crystal plate (2) the main cross-section of which is perpendicular to the reflecting surfaces of the both reflectors (4, 6).</p> |
