| 摘要 |
PURPOSE:To detect the baking state of a coating film accurately on-line basis by detecting the baking state of the coating film from reflection factors before and after coating. CONSTITUTION:A reflection factor measuring instrument 20 which measured the reflection factor of the surface of a strip before coating is provided at the entrance side and a reflection factor measuring instrument 24 which measures the reflection factor after the coating is provided at the exist side of a backing furnace 14; and a comparator 28 calculates the quantities of variation of values L* and b* before and after the coating from both outputs of computing elements 22 and 26. Consequently, the baking state of the coating film is detected accurately on on-line basis.
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