发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To prevent fluctuation of the characteristics such as current amplification factor by a method wherein with the electrode material layer pattern CONSTITUTION:After a polycrystalline siicon layer 30 containing no impurity is deposited on the whole surface by the CVD method, arsenic is ion-implanted.
申请公布号 JPS61224448(A) 申请公布日期 1986.10.06
申请号 JP19850065231 申请日期 1985.03.29
申请人 TOSHIBA CORP 发明人 IWASAKI HIROSHI
分类号 H01L21/225;H01L21/331;H01L21/8226;H01L21/8248;H01L21/8249;H01L27/02;H01L27/082;H01L29/06;H01L29/45;H01L29/73;H01L29/732 主分类号 H01L21/225
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