发明名称 DEFECT SIZE DISCRIMINATING CIRCUIT
摘要 PURPOSE:To simplify a circuit and to economize the capacity of a storage device by providing a logic circuit which inhibits the other elements from outputting defect signals when the defect signal is generated from one element of a linear array multielement photodetector. CONSTITUTION:With respect to outputs of individual elements of a linear array multielement photodetector 5, defect signals are generated by amplifiers 7-1-7-6 and comparators 8-1-8-6. Defect signals are inputted to 6-input AND circuits 11-1-11-6 respectively. Signals obtained by allowing outputs of the other AND circuits to pass NOT circuits 12-1-12-6 are inputted to the other five inputs of each of circuits 11-1-11-6. Consequently, each of circuits 11-1-11-6 outputs one defect signal, and their outputs are inputted to a 6-input OR circuit 13, and the output is used as a gate signal of a counter to discriminates the defect with one counter. Thus, the circuit is simplified and the capacity of the storage device is reduced.
申请公布号 JPS61223635(A) 申请公布日期 1986.10.04
申请号 JP19850065163 申请日期 1985.03.29
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 SO KOJI;KANNO TAKAFUMI;MOMOO KAZUO;SHIOZUKA KAZUMASA
分类号 G01N21/88;G01B11/30;G01N21/89;G01N21/95 主分类号 G01N21/88
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