| 摘要 |
<p>An electrical test arrangement has two arrays of conductive probes (2, 3) for contacting the opposite faces of a double sided printed circuit board (1). Both arrays are mounted on the walls (14) of an evacuated chamber, reduction in pressure of which urges the two arrays together so as to sandwich the circuit board between them. One array (2, 3) is mounted in a hinged manner to allow access for the circuit board, and the connection between this array and an electrical input/output port is made via make and break contacts (31, 32) which are operated by the change in pressure which causes movement of the arrays.</p> |
