发明名称 NON-SYNCHRONIZING TESTER
摘要 PURPOSE:To simplify a constitution by storing an output data of an LST to be measured by a line memory, thereafter inputting it to an LSI tester to decide a logic. CONSTITUTION:An input data inputted through a bus 1, terminals 16, 17 from an LSI tester is given to a control circuit 4 through a CRT controller lSI 12 and a high speed buffer 3. A control circuit 9, in accordance with a mode changeover input signal given to a terminal 8, produces a sampling clock (SC) pulse from a master clock pulse applied to a terminal 7. This (SC) pulse is applied to the circuit 4. The circuit 4 synchronizes with this SC pulse, performs a sampling to a drawing data from an LSI 2 fed through the buffer 3 on a data of one line. This sampling data is fed to a line memory 5. The memory 5 successively inputs the data of one line by a shift clock pulse applied through a speed change-over OR circuit 12 from the circuit 9 and the stored data of the one line is successively outputted 6.
申请公布号 JPS61210974(A) 申请公布日期 1986.09.19
申请号 JP19850052806 申请日期 1985.03.15
申请人 SHARP CORP 发明人 ISHITSUKI NORIYOSHI;MURAMATSU TOSHIHIKO
分类号 G01R31/28;G06F11/273 主分类号 G01R31/28
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