发明名称 APPARATUS FOR DETECTING ABNORMALITY
摘要 PURPOSE:To detect that abnormality other than noise was generated in a measuring signal without delay, by smoothing a measuring signal by an adaptive type filter and further calculating a differential signal showing steepness of the wave form of the smoothed value and the estimation error of low frequency noise and a present value by a differential filter, a noise estimation device and a square deviation calculator. CONSTITUTION:The high frequency noise of a measuring signal is removed by an adaptive type filter constituted of a combination of Haar conversion and inverse Haar conversion and a differential signal showing the steepness of a wave form and a square deviation signal showing the estimation error of low frequency noise and a present value are further calculated by estimation calculation and square deviation calculation due to differentiation and a self- regression model and, by using both of them, it is detected that abnormality other than noise was generated in the measuring signal. At the same time, a pulse like signal with a specific shape is extracted by a Haar signal to judge whether abnormality is generated and, therefore, the presence of an abnormal point is detected without delay to issue and alarm and detection capacity can be enhanced.
申请公布号 JPS61200436(A) 申请公布日期 1986.09.05
申请号 JP19850040444 申请日期 1985.03.01
申请人 MITSUBISHI ELECTRIC CORP 发明人 TOJO NAOYUKI
分类号 H02H5/00;G01H17/00;G01V3/08 主分类号 H02H5/00
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