| 摘要 |
PURPOSE:To inspect easily an output characteristic by using an IC tester of simple constitution, by constituting a titled circuit so that an output level of an output buffer stage is held in a prescribed DC voltage level. CONSTITUTION:A gate circuit is provided on the pre-stage of an output buffer stage, so that an applied testing DC voltage is applied to the gate circuit. In case of operating an integrated circuit, a test pin TEST is grounded in advance. Therefore, from an OR gate OR, an output signal of a processing circuit PC is outputted as it is, and a regular operation is executed. Subsequently, in case of measuring an output characteristic, an output of an output buffer BUF is held in a low level by applying a test signal of a signal level to the test pin TEST. In this way, the output characteristic can be measured by only applying the testing DC voltage to the integrated circuit to be measured, and the output characteristic can be inspected by using an inexpensive IC tester. |
