发明名称 METHOD FOR INSPECTION BY IMAGE PROCESSING
摘要 PURPOSE:To decide whether operation is normal or not, and to find the malfunction of a machine device which machines an object early and prevent a defective from being produced by comparing picked-up images of the object before and after operation with each other. CONSTITUTION:When, for example, a semiconductor element is wire-bonded, a lead frame 2 is connected to the semiconductor element 1, external leads are wired, and electrodes 5 and 4 are connected. Their image is picked up through a microscope optical system and the video signal of a TV camera is led to an image device. At this time, the image device extracts an image (c) of a part where there is variation owing to operation by using an image (a) before the wire bonding and an image (b) after the wire bonding. Then, a thin-line image (d) is obtained by image processing such as line thinning processing, line tracking, terminal-point coordinate tracking. Then, it is decided whether the operation is normal or not from the image (c) and line-thinned image (d). Thus, the difference between the images before and after the operation is detected, so it is easily decided whether the operation is normal or not.
申请公布号 JPS61193053(A) 申请公布日期 1986.08.27
申请号 JP19850032648 申请日期 1985.02.22
申请人 HITACHI LTD 发明人 EJIRI MASAKAZU;KASHIOKA SEIJI;SHIMA YOSHIHIRO
分类号 G01N21/88;G01B11/00;G01N21/956;H01L21/60;H01L21/66;H04N7/18 主分类号 G01N21/88
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