| 摘要 |
PURPOSE:To enable burn-in processing capable of coping with the change in the content allotted to a pin by a semiconductive element, by supplying the signal value or voltage supplied to each pin of the semiconductive element while changing over the same corresponding to said pin. CONSTITUTION:Each pin except an output pin among pins of LSI 101, 102 ...10n to be subjected to burn-in is connected to the corresponding latch in a latch group 12 through the corresponding relay in relay group 11. The output pin is connected to power source VTT through the corresponding relay in the relay group 11. This relay connection is performed by the output signal of a relay chang-over signal generation circuit 13. By this constitution, for example, even if LST to be subjected to burn-in changes and difference is generated in each signal connected to the pin, the signal set to latch is properly altered and the change-over of each relay of the relay group 11 is adequately performed by the circuit B to eliminate the difference of each signal and required burn-in can be applied to LSI. |
