SEMICONDUCTOR MEMORY

摘要

PURPOSE:To obtain a semiconductor memory containing a test mode for functions of an ECC (error detection/correction) circuit system by using virtual data for the ECC circuit system. CONSTITUTION:A write check bit latch circuit is provided to store temporarily the write check bit together with a check bit switching circuit 12 which switches the data supplied to a syndrome generating circuit 5 according to a control signal TE and an input switch circuit 10 which switches the data supplied to a read check bit generating circuit 4 according to the signal TE. Thus the virtual data can be used for an ECC circuit system and therefore an independent test is possible with functions of the ECC circuit system.