| 摘要 |
PURPOSE:To enable simultaneous operation of qualitative and qantitative work by entering names of elements and standard sensitivity curves together corresponding to a wavelength scale to match with a chart scale of an electron beam microanalyzer. CONSTITUTION:A wavelength axis 2 and an X ray intensity axis 3 are plotted to coincide with a chart scale of a microanalyzer. Names of elements are put at positions corresponding to a wavelength scale, standard sensitivity curves 4 are drawn with the X ray intensity for a spectrographic crystal corresponding to the wavelength scale and moreover, auxiliary curves 4a, 4b, 4c... are entered as obtained by equally dividing the curves 4. Then, a reading scale is placed on a chart obtained by setting a sample on an electron beam microanalyzer to match the wavelength axis 2 thereof with that of the chart, the name of element is read out corresponding to the peak memorized in the chart while the parcentage is done from the curve 4 or the auxiliary curves 4a-4c... coinciding with the peak. Thus, the elements contained in the sample and the ratio in the sample can be simultaneously. |
