发明名称 METHOD AND DEVICE FOR GRINDING WAFER
摘要 PURPOSE:To machine the surface of a wafer with high accuracy by finishingly grinding the surface of said wafer after carrying out rough grinding. CONSTITUTION:After wafers 3 are delivered in order from a loader 4 onto the wafer chuck table 2 on a defined position of a rotary table 1 by means of a delivery mechanism, the wafer 3 is fixed and held with its circuit-formed surface faced up, on this table 2 by means of vacuum adsorption. The wafer 3 thus fixed and held is subjected to rough grinding by means of a cup wheel 9 of a rough grinding mechanism 6 while the rotary table 1 is rotated at a certain angle. Then, by further rotating the rotary table 1 at a certain angle, the wafer 3 is subjected to a plane surface grinding accurately by means of a straight grinding stone 11 during this rotation.
申请公布号 JPS61164773(A) 申请公布日期 1986.07.25
申请号 JP19850005700 申请日期 1985.01.18
申请人 HITACHI LTD 发明人 SHIMURA TAKASHI;YUI HAJIME;YAMAMOTO SATORU;ISHIHARA TAKAO
分类号 B24B7/22;H01L21/304 主分类号 B24B7/22
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