发明名称 MODEM TESTING SYSTEM
摘要 PURPOSE:To offer a MODEM testing system effective for seeking a fault of a MODEM of half duplex communication which has used a two-wire communication circuit, by sending a test pattern request signal from a main MODEM, and generating and sending back a test pattern from a sub-MODEM, when it has received said signal. CONSTITUTION:A test pattern request signal 202 is generated by a test pattern request signal generating circuit 4, and this signal is modulated by a modulating circuit 7, and sent out to a two-wire communication circuit 15. After sending-out of the signal concerned has been completed, a main MODEM1 becomes a receivable state by a two-wire controlling circuit 9. On the other hand, a sub-MODEM 2 demodulates said test pattern request signal 202 from the main MODEM1, by a demodulating circuit 8, detects is by a test pattern request signal detecting circuit 11, generates a test pattern 204 (for instance, a false random signal of 511 bits) by a test pattern generating circuit 10, and said pattern is sent out to the two-wire communication circuit through a transmitting data switching circuit 6 and the modulating circuit 7, and sent back to the main MODEM1.
申请公布号 JPS61163761(A) 申请公布日期 1986.07.24
申请号 JP19850003338 申请日期 1985.01.14
申请人 HITACHI DENSHI LTD 发明人 MIZUNO ATSUSHI
分类号 H04L29/14;H04L1/24;H04L27/00 主分类号 H04L29/14
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