| 摘要 |
PURPOSE:To curb the reduction of an effective chip area of a semiconductor device by a construction wherein a part of a circuit provided in the semiconductor device is used for reading out information on sort, and it can be used as an ordinary circuit after the information on sort is read out. CONSTITUTION:A sort specifying circuit 50 is formed by using an electric circuit of a semiconductor device, and pads 31, 32,...3n for reading out information specifying sort are connected to said sort specifying circuit 50. The semiconductor device to be tested is set in a semiconductor testing apparatus and driven by a prescribed power supplied from source terminals VDD and VSS. Then data showing the sort of the semiconductor device to be tested are outputted from the sort specifying circuit 50 of the semiconductor device. Based on these data, the semiconductor testing apparatus loads automatically a test program for the semiconductor device to be tested, and thereby a test is executed. |
