发明名称 MEASURING INSTRUMENT FOR ELECTRONIC COMPONENT
摘要 PURPOSE:To improve measurement efficiency by providing a device which conveys an electronic component to a socket part for measurement and inserts it into the socket part, then extracts the electric component inserted into the socket part for measurement from the socket part and conveys it to a carry-out part. CONSTITUTION:Socket parts 51 and 52 have an insertion hole 55 for a pin terminal 54 to be provided at both sides of the main body part 53 of a DIP type IC45, and the pin terminal 54 is inserted and extracted. A transfer device 56 is arranged at opposite positions of the socket parts 51 and 52 and this transfer device 56 conveys the IC45 which is supplied to the IC carrying-in part 46 to the socket part 51 for AC characteristic measurement and further to the socket part 52 for DC characteristic measurement. Consequently, while the IC45 is conveyed successively from the IC carrying-in part 46 to an IC carrying-out part 47, AC and DC characteristics of each IC45 are measured and the measurement efficiency is improved.
申请公布号 JPS61153573(A) 申请公布日期 1986.07.12
申请号 JP19840273815 申请日期 1984.12.27
申请人 TOSHIBA SEIKI KK 发明人 ABE SHINRI
分类号 G01R31/00;G01R31/26 主分类号 G01R31/00
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