发明名称 |
MANUFACTURE OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE:To make the resist process needless by effecting the selective etching of the polycrystalline or amorphous thin film by utilizing a difference in etching rate by recrystallizing the desired part of the pattern of said film by laser annealing. CONSTITUTION:A polycrystalline or amorphous thin film 1 is formed on a substrate 3 and a part of this is recrystallized by laser annealing so as to form a minute pattern part 2 whose etching rate is smaller than that of the part not irradiated with a laser. Accordingly when this wafer is etched by use of RIE and etc., the part except the pattern part 2 can be etched selectively without using a particular mask such as of a resist. |
申请公布号 |
JPS61150337(A) |
申请公布日期 |
1986.07.09 |
申请号 |
JP19840275607 |
申请日期 |
1984.12.25 |
申请人 |
MITSUBISHI ELECTRIC CORP |
发明人 |
SADAHIRO SHIGEKI;CHIBA AKIRA;SAKAGAMI KIYOSHI;ITAKURA HIDEAKI |
分类号 |
H01L21/302;(IPC1-7):H01L21/302 |
主分类号 |
H01L21/302 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|