| 摘要 |
PURPOSE:To prevent a damage to a specimen in an electron microscope by decreasing the amount of an electron beam for focusing the image of the microscope as compared with that of an electron beam for obtaining a final output image. CONSTITUTION:A portion of a cumulative sheet 10 is irradiated with an electron beam 2 and stores electron beam energy carrying an enlarged scattered image 8b. In this case, the amount of the electron beam for focusing the image of the microscope is set to a value smaller than that of an electron beam for recording the final output image 8b by operating a switch 31 for adjusting the amount of electron beam to decrease the filament current of an electron gun 3 to thereby reduce thermoelectron. Then this portion of the sheet 10 is moved and an excitation light beam performs a main and an auxiliary scannings in the direction of the width of the sheet 10 and in the direction vertical thereto, respectively, the latter by a roller 101. Thus, an accelerated phosphorescence emitted from the sheet 10 passes through a condenser 14 and it is photoelectrically transduced a photoelectric transducer 15, reproducing the image with a high sensitivity.
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