发明名称 |
MANUFACTURE OF SEMICONDUCTOR DEVICE |
摘要 |
<p>PURPOSE:To equalize and stabilize characteristics by fixing a temperature- compensating plate on the anode side of an silicon semiconductor substrate by an alloy and thermally treating the whole in an N2 atmosphere. CONSTITUTION:A temperature-compensating plate 6 is fastened on the anode region 4 side of an silicon semiconductor substrate at approximately 730 deg.C through aluminum solder 5 as an alloy, and the whole is thermally treated for 1hr or more in an N2 atmosphere at 600-700 deg.C. When a recombination center generated on the interface between an insulating film 1 such as an silicon dioxide film on the cathode region 3 side and the surface of the silicon semicon ductor substrate is reduced by adding a heat treatment process and a cathode junction is forward-biassed, the injection efficiency of electrons to a base region 9 from a cathode region 3 is improved, and the current amplification factor of a transistor consisting of NE-PB-NB is enhanced. The lifetime of an NB layer is lengthened through the heat treatment, thus also improving characteristics.</p> |
申请公布号 |
JPS61135161(A) |
申请公布日期 |
1986.06.23 |
申请号 |
JP19840256562 |
申请日期 |
1984.12.06 |
申请人 |
INTERNATL RECTIFIER CORP JAPAN LTD |
发明人 |
ASADA TAKESHI;YAMAGUCHI YASUO;SHISHIDO CHOJI |
分类号 |
H01L29/74;H01L21/60;H01L23/36 |
主分类号 |
H01L29/74 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|