发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 <p>PURPOSE:To equalize and stabilize characteristics by fixing a temperature- compensating plate on the anode side of an silicon semiconductor substrate by an alloy and thermally treating the whole in an N2 atmosphere. CONSTITUTION:A temperature-compensating plate 6 is fastened on the anode region 4 side of an silicon semiconductor substrate at approximately 730 deg.C through aluminum solder 5 as an alloy, and the whole is thermally treated for 1hr or more in an N2 atmosphere at 600-700 deg.C. When a recombination center generated on the interface between an insulating film 1 such as an silicon dioxide film on the cathode region 3 side and the surface of the silicon semicon ductor substrate is reduced by adding a heat treatment process and a cathode junction is forward-biassed, the injection efficiency of electrons to a base region 9 from a cathode region 3 is improved, and the current amplification factor of a transistor consisting of NE-PB-NB is enhanced. The lifetime of an NB layer is lengthened through the heat treatment, thus also improving characteristics.</p>
申请公布号 JPS61135161(A) 申请公布日期 1986.06.23
申请号 JP19840256562 申请日期 1984.12.06
申请人 INTERNATL RECTIFIER CORP JAPAN LTD 发明人 ASADA TAKESHI;YAMAGUCHI YASUO;SHISHIDO CHOJI
分类号 H01L29/74;H01L21/60;H01L23/36 主分类号 H01L29/74
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