发明名称 Resistor structure for transistor having polysilicon base contacts
摘要 Disclosed is a dumbbell-shaped resistor structure fabricated in a semiconductor substrate for determining the resistivity of the intrinsic base of a polysilicon base transistor. The structure includes an n-doped base region having two large parts separated by a narrow part, resembling a flattened dumbbell, each of which extends into the substrate. A p-type emitter region extends a distance into a portion of the narrow and the second large parts of the base region. An n-type reach-through region extends from the emitter region through the base region electrically isolating a portion of the narrow and second large parts of the base region from the remainder of the base region and forming an electrically continuous p-type path between the first large part of the base region and the portion of the second large part within the reach-through region.
申请公布号 US4595944(A) 申请公布日期 1986.06.17
申请号 US19830566597 申请日期 1983.12.29
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 ANTIPOV, IGOR
分类号 H01L27/04;H01L21/285;H01L21/331;H01L21/822;H01L29/10;H01L29/73;H01L29/732;H01L29/8605;(IPC1-7):H01L27/02;H01L29/06 主分类号 H01L27/04
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