发明名称 AUTOMATIC INSPECTION DEVICE
摘要 PURPOSE:To enhance a measuring resolution and attain a high speed measuring by amplifying only an alternate current component of an output signal of an image signal processing circuit of a color television camera and automatically measuring a flatness of a wave shape by a desired sampling number in a desired field period. CONSTITUTION:From an image signal processing circuit in a camera, an output measuring object signal 1 is inputted to a buffer circuit 2 and an image output signal 5 of the camera is inputted to synchronous separating circuit 6. In a timing forming circuit 10, an odd number field or an even number field synchronous signal is selected, further, plural number of horizontal scanning spots to be measured are selected from the horizontal scanning spots in the selected field and a signal to be a logical 1 in a period corresponding to a horizontal scanning period is given to a gate circuit 12. A processing unit 16 carries out a reading control of a memory circuit 14, reads a data from the circuit 14, obtains a maximum and a minimum every horizontal scanning period from the data and when the difference therebetween is smaller than a predetermined value, a flatness is satisfied but when it is larger, the flatness is not satisfied and the result is displayed in a display device 18.
申请公布号 JPS61128695(A) 申请公布日期 1986.06.16
申请号 JP19840249535 申请日期 1984.11.28
申请人 HITACHI LTD 发明人 MIYASHITA KAZUYOSHI
分类号 H04N17/00 主分类号 H04N17/00
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