发明名称 STORAGE DEVICE
摘要 PURPOSE:To shorten the recovery processing time of the soft error of a storage element due to alpha rays and recover the error efficiently by reading out all address spaces of a storage circuit in every refresh operation cycle to detect errors. CONSTITUTION:A refresh interrupt control circuit 13 has a timer circuit to generate periodically a refresh interrupt request 14. Internal address information is generated from an internal address generating circuit 15 at every this period, and read error due to the internal address at this time is checked by an error detecting and correcting circuit 8. If the soft error of the storage element due to alpha rays is detected as a one-bit error as the check result, this bit is corrected. Next, the normal write operation is performed, and corrected data is written again in the storage circuit in the same address through a data selecting switch 2 and an error correction code generating circuit 4. This operation is performed for all address spaces of a storage circuit to recover the soft error effectively in a short time.
申请公布号 JPS61117641(A) 申请公布日期 1986.06.05
申请号 JP19840238195 申请日期 1984.11.12
申请人 NEC CORP 发明人 ISHIKAWA KENJI
分类号 G06F11/10;G06F11/08;G06F12/16 主分类号 G06F11/10
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