发明名称 Optoelectronic measurement information system
摘要 The invention relates to an optoelectronic measurement information system for detecting various measurement data of the level close to the process and the optical forwarding of the measurement information items obtained and their evaluation in a measuring and processing unit. The use of the measurement information system according to the invention is of particular advantage where electromagnetic interference fields influence the reliability of a transmission system. It is the aim of the invention to increase the reliability of the total system by using optical waveguides and other optical assemblies in the transmission of measurement information items from the level close to the process to the measurement control centre. The invention is based on the object of developing an optoelectronic measurement information system which completely uses light as a transmission medium and optically transmits a number of measurement information items. The object is achieved according to the invention by the fact that the measurement information items are interleaved in time by means of a chopper disc. The light pulses, offset in time, are supplied to optical measurement information transmitters. The measurement information items obtained are evaluated in a measuring and processing unit.
申请公布号 DE3526049(A1) 申请公布日期 1986.06.05
申请号 DE19853526049 申请日期 1985.07.20
申请人 VEB ELEKTROPROJEKT UND ANLAGENBAU BERLIN 发明人 MICHAILOFF,MICHAIL,DR.-ING.;HAERTIG,THOMAS,DIPL.-ING.;HOFMANN,DETLEF,DIPL.-ING.;MARTENS,FRIEDER,DIPL.-ING.
分类号 G01D5/26;(IPC1-7):G01D5/26;G08C15/06 主分类号 G01D5/26
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