| 摘要 |
PURPOSE:To elevate the accuracy in the measurement of spectrum peculiar to a sample, by providing a shutter to shut down incident light into a reference light detection system and a fluorescence detection system to enable accurate correction of wavelength characteristic of a photometer. CONSTITUTION:A photometer which has a light source 10 comprising a Xe-lamp, a reference light detection system comprising an excitation side slit plate 14, the excitation side grating 16 and the like, a fluorescence detection system comprising a fluorescence side slit plate 34 and a fluorescence side grating 36 and the like and an arithmetic unit 46 is equipped with a shutter 48 to be controlled by a control system 42. Then, after the shutter 48 is closed and the excitation side slit plate 14 is turned to the position at which no light of the light source 10 is incident into a monitor detector 30 and measured values IMO and ISO in the zero-point deviation of a monitor detector 30 and a fluorescence detector are inputted into the arithmetic unit 46. Then, the shutter 48 is opened and the excitation side slit plate 14 is returned to the original position and a monitor signal IM and a fluorescence signal IS are measured to calculate the measured value I with the arithmetic unit 46. Thus, the wavelength value I with the arithmetic unit 46. Thus, the wavelength characteristic is corrected accurately thereby enabling simple measurement of spectrum peculiar to a sample.
|
