THICKNESS MONITOR FOR COATING SILICON WAFER,申请号USD3492491-传众专利搜索

首页产品黄页商标征信

会员服务注册登录

法人/股东/高管

发明名称	THICKNESS MONITOR FOR COATING SILICON WAFER
摘要
申请公布号	US3492491(A)	申请公布日期	1970.01.27
申请号	USD3492491	申请日期	1967.03.03
申请人	OPTOMECHANISMS INC.	发明人	ROLAND C.M. BEEH
分类号	G01B11/06;G05D5/03;(IPC1-7):H01J39/12	主分类号	G01B11/06
代理机构		代理人
主权项
地址

您可能感兴趣的专利

Method and apparatus for coating a solution containing brazing alloy powders and coating head for the curtain coater

Motorized lock actuator for cylindrical lockset

Method and apparatus for fractionation of a mixture on a simulated fluidized bed in the presence of a compressed gas, a supercritical fluid or a subcritical liquid

Flange joint assembly

Optical symbol (bar code) reading systems having an electro-optic receptor with embedded grating rings

Multiprocessor circuit

Programmable automatic controller having a configuration circuit cooperating with a monitor logic to selectively transmit a different return output frame

Operation control technique for computer system by driving a command procedure with reference to events recorded on a logging storage computer operation control by automatic decision making based on events on a logging storage

Low capacitance protection circuit for telephone equipment

Ferroelectric smetic liquid crystal device

Satellite broadcast receiving apparatus capable of forming co-distributing system

Data stream converter with increased grey levels

Magnetic resonance probehead

Methods and compositions for inhibiting 5 alpha -reductase activity

Quinuclidine derivatives

Method of manufacturing a precision integrated resistor

Side wall electrical battery terminal

Synthetic fibers containing photochromic pigment and their preparation

Method of coating a ceramic body

Process for preparing a gelled food product sheet