发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF
摘要 PURPOSE:To improve the drape of a gate insulation film at the edge of a metallic layer by a method wherein the stepwise differences between the gate and an insulation substrate which is the base by filling the periphery of the gate with an insulation layer. CONSTITUTION:A Cr gate film 2 of approx. 2,000Angstrom thickness is selectively formed on a glass plate 1, and a photo-permeable SiO2 film 13 of the same thickness and a negative photosensitive resin film 14 are put thereon. When the films are developed by irradiation with a large amount of ultraviolet rays 5 from the back of the substrate 1, a resin pattern 14' having an aperture 16 slightly smaller than the Cr film 2 can be obtained. Next, a projection 17 of the SiO2 film on the edge of the gate film 2 is smoothened low by opening the SiO2 film 13 through somewhat long etching. Since this construction enables a gate insulation film 3 to be formed to a flat surface by filling the insulation layer 13 with a gate metal 2, the gate insulation film can be thinned without becoming thinner at the edge of the gate metal 2, and the integration of the device is enabled.
申请公布号 JPS6144469(A) 申请公布日期 1986.03.04
申请号 JP19840167087 申请日期 1984.08.09
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 SAITO HIROKI;ANDO DAIZO;KAWASAKI KIYOHIRO
分类号 H01L29/78;G02F1/1333;H01L21/336;H01L27/12;H01L29/786 主分类号 H01L29/78
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