发明名称 |
Nonvolatile semiconductor memory device with electrically selectable, erasable and programmable function |
摘要 |
A nonvolatile semiconductor memory device has a memory cell array including a MOS FET with a floating gate, first and second control gates and a program electrode; column and row decoders for selecting a specific memory cell; a program control circuit for programming data on the floating gate; and a timing circuit for providing operation timings of the column and row decoders and the program control circuit. The timing circuit sets up a program inhibit period ranging over time point at which a selected memory cell is to be erased and programmed. In the program inhibit period, one of the first and second control gates of each of the memory cells is at a high potential, while the other control gate is at low potential.
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申请公布号 |
US4571705(A) |
申请公布日期 |
1986.02.18 |
申请号 |
US19830527483 |
申请日期 |
1983.08.29 |
申请人 |
TOYKO SHIBAURA ELECTRIC CO |
发明人 |
WADA, MASASHI |
分类号 |
H01L27/112;G11C16/02;G11C16/04;G11C16/32;G11C16/34;G11C17/00;H01L21/8246;H01L21/8247;H01L29/788;H01L29/792;(IPC1-7):G11C7/00;G11C11/40 |
主分类号 |
H01L27/112 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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