发明名称 Nonvolatile semiconductor memory device with electrically selectable, erasable and programmable function
摘要 A nonvolatile semiconductor memory device has a memory cell array including a MOS FET with a floating gate, first and second control gates and a program electrode; column and row decoders for selecting a specific memory cell; a program control circuit for programming data on the floating gate; and a timing circuit for providing operation timings of the column and row decoders and the program control circuit. The timing circuit sets up a program inhibit period ranging over time point at which a selected memory cell is to be erased and programmed. In the program inhibit period, one of the first and second control gates of each of the memory cells is at a high potential, while the other control gate is at low potential.
申请公布号 US4571705(A) 申请公布日期 1986.02.18
申请号 US19830527483 申请日期 1983.08.29
申请人 TOYKO SHIBAURA ELECTRIC CO 发明人 WADA, MASASHI
分类号 H01L27/112;G11C16/02;G11C16/04;G11C16/32;G11C16/34;G11C17/00;H01L21/8246;H01L21/8247;H01L29/788;H01L29/792;(IPC1-7):G11C7/00;G11C11/40 主分类号 H01L27/112
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