发明名称 Apparatus for determining the degree of oxidation of an oxide coating.
摘要 <p>A method and apparatus determines the thickness of a copper oxide coating of an object by measuring the quantity of light reflected from the object in at least two wavelength zones, and then determining a value for a relationship between those quantities, for example, the ratio or difference of those quantities. The value is then compared to a predetermined, regular correspondence between such values and copper oxide thicknesses to determine the object's copper oxide thickness.</p>
申请公布号 EP0169664(A1) 申请公布日期 1986.01.29
申请号 EP19850304423 申请日期 1985.06.20
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 TOMINAGA, MAMORU C/O PATENT DIVISION;MORI, LEO C/O PATENT DIVISION;AKIYAMA, JUNETSU C/O PATENT DIVISION
分类号 G01N21/27;G01B11/06;G01N21/31 主分类号 G01N21/27
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