TESTING DEVICE FOR SEMICONDUCTOR DEVICE,申请号JP19840139625-传众专利搜索

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发明名称	TESTING DEVICE FOR SEMICONDUCTOR DEVICE
摘要
申请公布号	JPS6119142(A)	申请公布日期	1986.01.28
申请号	JP19840139625	申请日期	1984.07.05
申请人	NIPPON DENKI KK	发明人	YAMAZAKI JIYUNJI
分类号	H01L21/66;G01R1/073	主分类号	H01L21/66
代理机构		代理人
主权项
地址

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