发明名称 |
Use of an electronic vernier for evaluation of alignment in semiconductor processing |
摘要 |
An electronic vernier is presented which detects and quantifies misalignment between layers of material deposited upon a semiconducting wafer. Verniers may be constructed which evaluate alignment between two conducting layers, between two conducting layers and an insulating layer and between a semiconducting layer and a capacitive layer. Circuitry is described which shows how output from a vernier may be detected and quantified in order to evaluate the amount of misalignment.
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申请公布号 |
US4566193(A) |
申请公布日期 |
1986.01.28 |
申请号 |
US19840636480 |
申请日期 |
1984.07.31 |
申请人 |
HEWLETT-PACKARD COMPANY |
发明人 |
HACKLEMAN, DAVID E.;ADAMS, RICHARD F.;RICHLING, WAYNE P. |
分类号 |
G01R31/26;G01B7/31;H01L21/67;H01L21/68;(IPC1-7):G01B7/00;G08C21/00 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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