发明名称 SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE:To prevent the breakdown of informations at high potential stored in a memory cell by forming a source and a drain in a MOSFET to a reverse conduction type semiconductor layer shaped to the surface section of a semiconductor substrate and arranging a capacitor to a V-groove. CONSTITUTION:N<+> type layers 61, 62 as a drain and a source in a MOSFET 6 are formed onto a P<-> type semiconductor layer 15 shaped onto the surface of an N-type semiconductor substrate. On the other hand, a capacitor 7 consisting of conductive layers 71, 73 formed through an insulating film 72 are disposed onto an insulating film 53 added onto the surface of a groove 52 shaped in the direction of the substrate 5 from the surface of the layer 51. When a reverse bias is applied between the layer 51 and the substrate 5 in the constitution, a depletion layer 55 is formed to the lower section of the film 53 and extending over a section between the layer 51 and the substrate 5. When the surface is irradiated by alpha-particles under the state, alpha-rays intrude to the groove 52 section and electrons are generated in the depletion region of the lower section of the film 53, the electrons flow in toward the substrate 5 further brought to high potential along the electric field of the layer 55. Accordingly, informations stored in the capacitor are not lost.
申请公布号 JPS6173365(A) 申请公布日期 1986.04.15
申请号 JP19840193893 申请日期 1984.09.18
申请人 FUJITSU LTD 发明人 TAKEMAE YOSHIHIRO
分类号 H01L27/10;H01L21/8242;H01L27/108 主分类号 H01L27/10
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