发明名称 SWEEPING METHOD OF OVERLAPPED-FIELD MASS SPECTROMETER
摘要 PURPOSE:To determine both the mass and energy of daughter ions by arranging in front of an overlapped field the second overlapped field completely similar to it to form an overlapped-field mass spectrometer and using a sweeping method adjusting the electric field voltage of two overlapped fields. CONSTITUTION:A collision chamber 5 is arranged at an ion convergence point by the first mass spectrometer, and an overlapped-field mass spectrometer provided with the second overlapped-field B similar to an overlapped field A in front of it between the collision chamber 5 and a collector 4 is arranged as the second mass spectrometer. The voltage Vdx2 for generating the electric field of the front stage A and the voltage Vdx1 for generating the electric field of the rear stage B when daughter ions with known mass and energy are detected and the corresponding voltage respectively when unknown daughter ions are detected are determined, then the mass and energy of the unknown daughter ions is determined based on them. Accordingly, resolution is improved, and both the mass and energy of the unknown daughter ions can be determined without changing the strength of the magnetic field.
申请公布号 JPS614148(A) 申请公布日期 1986.01.10
申请号 JP19840125745 申请日期 1984.06.19
申请人 NIPPON DENSHI KK 发明人 NAITOU NORIHIRO
分类号 G01N27/62;H01J49/02;H01J49/32 主分类号 G01N27/62
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