发明名称 MINUTE DISPLACEMENT MEASURING APPARATUS USING SEMICONDUCTOR LASER
摘要 PURPOSE:To measure the minute displacement of an object to be measured in a non-contact state with good accuracy, by forming a composite resonator by constituting so as to be capable of feeding back reflected light from the object to be measured to a semiconductor laser. CONSTITUTION:When an object 4 to be measured is displaced in x- or y-direction in the drawing when the quantity of reflected light, that is, the quantity of feedback light is a proper definite value, the magnitude change in light output generates every when displacement quantity (x) changes by the half lambda/2 of the oscillation wavelength lambda of a semiconductor laser 1 from the relation between phases of emitted light and reflected light of the semiconductor laser 1 and light output is fluctuated. The light output of the semiconductor laser 1, that is, the input of a light detector 5 comes to a high level or a low level corresponding to a direction along which the change direction of the object 4 to be measured, that is, the speed of said object 4 to be measured approaches or goes away from the semiconductor laser 1. Therefore, the number of fluctuations of light output and a light output level are detected by the light detector 5 to make it possible to know the displacement direction and quantity of the object 4 to be measured.
申请公布号 JPS60256079(A) 申请公布日期 1985.12.17
申请号 JP19840113619 申请日期 1984.06.01
申请人 SHARP KK 发明人 YAMAMOTO OSAMU;MATSUI KANEKI;TAKIGUCHI HARUHISA;HAYASHI HIROSHI;MIYAUCHI NOBUYUKI
分类号 G01S17/08;G01B11/00;G01D5/26;H01S5/14 主分类号 G01S17/08
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