| 摘要 |
A portable high speed minicomputer tester is disclosed for isolating failures in a random access memory. The device includes a central processing unit having an address counter and means for generating a plurality of test words. Individual test words are generated automatically and stored in both an internal memory and the memory under test. At a predetermined address, a test word is read out of the memories and compared. If there are any discrepancies, the minicomputer sets a latch corresponding to the failed test word bit and identifies the failed bit on a digital display readout. Using fault conversion tables, an operator can trace a discrepancy to the bit location of a memory chip in the memory under test.
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