发明名称 FORMATION OF PATTERN
摘要 PURPOSE:To enhance resistances to heat and plasma by irradiating electron beams to a resist material contg. a homopolymer or the like having alpha-methylstyrene substd. by an alkylsilyl group on the ring as repeating units. CONSTITUTION:The resist material is composed of a homopolymer or copolymer contg. as repeating units, alpha-methylstyreene substd. by the alkylsilyl group as repeating units alone or in combination with other homopolymer or copolymer, and it is dissolved in a solvent, such as dioxane or cellosolve. A positive type resist pattern corresponding to a desired pattern is obtained by coating a substrate, such as a silicon wafer, with the obtained resist soln. in a film thickness of 0.5-1.5mum, baking it, exposing it to electron beams in a desired pattern, and developing it with a developing soln.
申请公布号 JPS60254128(A) 申请公布日期 1985.12.14
申请号 JP19840109456 申请日期 1984.05.31
申请人 FUJITSU KK 发明人 AKIMOTO SEIJI
分类号 G03F7/26;G03C1/72;G03C5/00;G03F7/039;G03F7/075;G03F7/20;H01L21/027 主分类号 G03F7/26
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