发明名称 |
Insulated type semiconductor devices |
摘要 |
In an insulated type semiconductor device, a metal member is disposed between an insulating member and a circuit element which includes a semiconductor substrate. The metal member is a composite metal member having at least two different kinds of metal layers bonded to each other. In a preferred embodiment, in order to reduce undesirable effects caused by differences in the thermal coefficients alpha I and alpha S of the insulating member and the semiconductor substrate, respectively, the thermal expansion coefficient of said composite metal member as a whole alpha M is adjusted in a range between alpha I and alpha S.
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申请公布号 |
US4556899(A) |
申请公布日期 |
1985.12.03 |
申请号 |
US19820386071 |
申请日期 |
1982.06.07 |
申请人 |
HITACHI, LTD. |
发明人 |
KURIHARA, YASUTOSHI;SUZUKI, YOSHIHIRO;OOUE, MICHIO;HACHINO, HIROAKI;YANAGI, MITSUO |
分类号 |
H05K1/05;H01L21/52;H01L21/58;H01L23/14;H01L23/40;H01L23/538;(IPC1-7):H01L23/14;H01L23/36;H01L23/54 |
主分类号 |
H05K1/05 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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