发明名称 Frequency marking systems
摘要 A frequency marker system for indicating the wavelength of light rays, said system comprising: means for collimating said light rays, first and second grating means aligned with at least a portion of said collimated light waves and separated by a distance DELTA for providing Moire patterns, means for determining the changes in wavelengths responsive to changes in frequency by determining deflections of the Moire patterns.
申请公布号 US4553839(A) 申请公布日期 1985.11.19
申请号 US19830463615 申请日期 1983.02.03
申请人 THE STASTE OF ISRAEL,ATOMIC ENERGY COMMISSION;KARNY, ZIV;MEYERSTEIN, DAN 发明人 KAFRI, ODED;KARNY, ZIV;MEYERSTEIN, DAN
分类号 G01J9/00;G02B27/60;(IPC1-7):G01J3/00 主分类号 G01J9/00
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