发明名称 |
Frequency marking systems |
摘要 |
A frequency marker system for indicating the wavelength of light rays, said system comprising: means for collimating said light rays, first and second grating means aligned with at least a portion of said collimated light waves and separated by a distance DELTA for providing Moire patterns, means for determining the changes in wavelengths responsive to changes in frequency by determining deflections of the Moire patterns.
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申请公布号 |
US4553839(A) |
申请公布日期 |
1985.11.19 |
申请号 |
US19830463615 |
申请日期 |
1983.02.03 |
申请人 |
THE STASTE OF ISRAEL,ATOMIC ENERGY COMMISSION;KARNY, ZIV;MEYERSTEIN, DAN |
发明人 |
KAFRI, ODED;KARNY, ZIV;MEYERSTEIN, DAN |
分类号 |
G01J9/00;G02B27/60;(IPC1-7):G01J3/00 |
主分类号 |
G01J9/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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