发明名称 METHOD FOR MEASURING THICKNESS OF OBJECT
摘要 PURPOSE:To measure exactly the thickness of an object by converting all the measured values existing in the time between observation waveforms to progressions and processing the same. CONSTITUTION:An ultrasonic wave is emitted from an ultrasonic sensor 2 to the object 1 and the wave reflected therefrom is detected by an ultrasonic sensor 2. The outputs from the sensors 2 are continuously sample in the time between the reflected waves measured by the reflection wave of said ultrasonic wave pulse and the sampled values are arrayed in order of the magnitude thereof and are made into progressions. The differences are further calculated by the terms before and after the sampled values in the progressions and the values up to the terms at which the difference of the sampled values is max. are extracted from the progressions and the average value thereof is calculated.
申请公布号 JPS60224004(A) 申请公布日期 1985.11.08
申请号 JP19840080851 申请日期 1984.04.20
申请人 SHOWA DENSEN DENRAN KK 发明人 KURIHARA MASAKAZU;ABE HITOSHI
分类号 G01B17/02;(IPC1-7):G01B17/02 主分类号 G01B17/02
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