发明名称 INSPECTING DEVICE FOR SOLID-STATE IMAGE PICKUP ELEMENT
摘要 PURPOSE:To detect securely foreign matter sticking on the protection glass surface of a solid-state image pickup element by rotating either of the solid-state image pickup element and a spot light source lamp at right angles to the photodetecting element array of the solid-state image pickup element. CONSTITUTION:The solid-state image pickup element or spot light source is rotated at right angles to the photodetecting element array of the solid-state image pickup element. Then, a spot light beam from the spot light source lamp is incident on the solid-state image pickup element 5, whose photoelectric conversion output signal is amplified by an amplifier 9 and then converted by a binary-coding circuit 10 into a binary-coded signal, which is supplied from an output terminal 11 to a printer part or oscilloscope. Therefore, foreign matter sticking on the protection glass surface of the solid-state image pickup element is detected easily and securely.
申请公布号 JPS60209187(A) 申请公布日期 1985.10.21
申请号 JP19840147908 申请日期 1984.07.17
申请人 MATSUSHITA DENSOU KK 发明人 UCHIDA SHIGERU;HARAUCHI KUNIO
分类号 G01R31/26;G01M11/00;H01L27/14;H04N1/00 主分类号 G01R31/26
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