发明名称 PROFILE MEASURING APPARATUS
摘要 PURPOSE:To omit distance correction and the like and to obtain the profile of a material to be measured accurately at a high speed, by simultaneously detecting the data of the profile of the material to be measured by a multichannel detector without mechanical scanning. CONSTITUTION:At first, a reference plate 23 is placed at a specified position and a radiation generator 21 is operated. Then calibration is performed. The reference thickness data from a multichannel detector 22 are supplied to a plurality of thickness converter parts 45-1, 45-2... in a predetermined order. Then, in place of the reference plate 23, a material to be measured 1 is placed on a specified position, and a radiation beam is projected. The outputs of the multichannel detector 22 are sampled and held, and the results undergoe A-D conversion and are sent to the corresponding thickness converter parts 45-1, 45-2.... Each thickness converter part receives the thickness data in the channel assigned by the transfer, compares the data with the preset reference thickness and computes the deviation. A CPU43 rearranges the deviation data in the order of the channels. The data is sent to an external HOST.CPU and the profile is computed.
申请公布号 JPS60207043(A) 申请公布日期 1985.10.18
申请号 JP19840063695 申请日期 1984.03.31
申请人 TOSHIBA KK 发明人 MURAKAMI JIYUNICHI;MASANOBU KAZUNORI
分类号 G01N23/04;G01B15/02 主分类号 G01N23/04
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