发明名称 METHOD FOR MEASURING THICKNESS DEVIATION OF FILMS
摘要 PURPOSE:To measure the thickness distribution of a continuously travelling film continuously and accurately on an on-line by measuring the temperature distribution of the film. CONSTITUTION:If a heating or cooling source is uniform and fixed from the viewpoint of timing in a direction for measuring its thickness in a heating or cooling area of a continuously travelling film, a phenomenon that the temperature of a fine part of the heating or cooling source is changed in inverse proportion to thermal capacity is applied to a film production process by an inflation method e.g. When the film extruded from a die 1 is to be wound around a winding roll 8, an infrared-ray thermometer 4 is arranged on a position showing temperature distribution in a direction for measuring thickness change; i.e., a position separated from an outlet of the die 1 by about 30-1,000mm.. The output of the thermometer 4 is processed by a computer 5, displayed on a computer screen 6 and also printed out by a printer 7.
申请公布号 JPS60203806(A) 申请公布日期 1985.10.15
申请号 JP19840061550 申请日期 1984.03.28
申请人 KANEGAFUCHI KAGAKU KOGYO KK 发明人 KOUNO KIMIHIKO
分类号 G01B21/30;G01B11/06 主分类号 G01B21/30
代理机构 代理人
主权项
地址