发明名称 DETECTION OF CONNECTION STAGE OF LOGICAL CIRCUIT
摘要 PURPOSE:To make it possible to continuously monitor the change at a connection part with the elapse of time, by detecting a connection state on the basis of the integrated value of the output from a ring oscillator constituted of a logical circuit containing the connection part of the electrode and the terminal of LSI. CONSTITUTION:A ring oscillator 16 is constituted of a logical circuit containing the electrode and the terminal of LSI. The output of this oscillator 16 is integrated by an integrator circuit 17 having predetermined time constant and the voltage of the integrated rusult is compared with reference voltage being constant voltage by a reference voltage comparator circuit 18. A judge circuit 19 judges a connection state on the basis of the magnitude of the integrated voltage to said reference voltage and a judge result is monitored. By this constitution, the change in the micro-bonding part of the connection part of the electrode and the terminal of an LSI logical circuit is continuously monitored and the point of time, when connection inferiority is generated, can be accurately grasped.
申请公布号 JPS60185173(A) 申请公布日期 1985.09.20
申请号 JP19840040324 申请日期 1984.03.05
申请人 HITACHI SEISAKUSHO KK 发明人 TAKENAKA TAKATSUGU;FUJITA BUNICHI
分类号 G01R31/04;G01R31/26;H01L21/66 主分类号 G01R31/04
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