发明名称 Measuring arrangement which can be mounted on a mitre or notching saw
摘要 The invention relates to a measuring arrangement, which can be mounted on a mitre or notching saw, for the cut of 45 DEG mitres on rebated strips of wood, plastic or similar material. The measuring arrangement consists of the mitre stop block, continuously adjustable on the stop rail of the saw, and of a fixed measuring scale arranged on the rail. According to the invention, a resiliently mounted rebate-depth scanner is accommodated in the lower part of the mitre stop block resting on the machine table, the respective travel of which rebate-depth scanner up to the stop at the rebate of an inserted strip is transmitted via a multiplication of 1:2 to the indicating slide, guided in the mitre stop block, for the measuring scale. <IMAGE>
申请公布号 DE3408943(A1) 申请公布日期 1985.09.19
申请号 DE19843408943 申请日期 1984.03.12
申请人 KIMMRITZ,WOLFRAM 发明人 KIMMRITZ,WOLFRAM
分类号 B23Q16/00;(IPC1-7):B27G5/02;G01B3/56 主分类号 B23Q16/00
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