| 摘要 |
PURPOSE:To enable the high-speed processing of flaw data by a system wherein two output signals delivered from sensors based on flaw detection are subjected to an analog operation to detect the peak values thereof, and the results on the position of a flaw and the size thereof obtained by a signal processing in combination with a microcomputer or the like are outputted automatically. CONSTITUTION:Flaw data in a substance 3 to be detected are detected by sensors 2 in wo sets, and output signals delivered on the basis of the detection are transmitted to an eddy current test device 1. Then characteristic curves are drawn in a flaw detection output display unit 1A so as to check up first the presence or absence of a flaw. Then, flaw data SX and SY in the flaw detection output display unit 1A are taken in a data detecting unit 4 and held once in hold circuits 6X and 6Y. In the data detecting unit 4, an operation of (SX)<2>+(SY)<2> is executed by squaring circuits 7X and 7Y and an addition circuit 8 and the maximum value obtained thereby is confirmed by a peak value detecting circuit 9. Then the result of the operation is transmitted to a microcomputer 5, and therein a computation of [(SX)<2>+(SY)<2>]<1/2> for showing the maximum value on an SX-SY curve in the flaw detection output display unit 1A is executed. The result of the computation is subjected to a data processing, and the size of the flaw is outputted. |
