| 摘要 |
PURPOSE:To adjust the skew of an IC tester while an IC to be measured is mounted in the IC tester by calculating the delay time of a cable for measurement by using a reference cable which is as long as the measurement cable. CONSTITUTION:A reference pin circuit Pr is provided in addition to pin circuits P1-Pn for inspection and the pin circuit Pr includes an output circuit Dr connected to a timing signal generating circuit 2 and an input circuit Cr connected to a timing signal detecting circuit 3 and other pin circuits P1-Pn. The tip of the reference cable Kr is not connected to the IC4 to be measured and made invariably open. The signal delay time of a cable Kr is obtained to know the delay time of cables K1-Kn for measurement equivalently. Consequently, the skew of the IC tester is adjusted while the IC to be measured is mounted on the IC tester, and even if the cable for measurement vary in cable length, the length of the reference cable is only required to vary correspondingly.
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